Brand Name: | ZMSH |
MOQ: | 5 |
Price: | by case |
Packaging Details: | custom cartons |
Payment Terms: | T/T |
High-Purity Semi-Insulating SiC Wafers are engineered for next-generation power electronics, RF/microwave devices, and optoelectronics. Our wafers are fabricated from 4H- or 6H-SiC single crystals using an optimized Physical Vapor Transport (PVT) growth process combined with deep-level compensation annealing. The result is a wafer with:
Ultra-High Resistivity: ≥1×10¹² Ω·cm, to suppress leakage currents in high-voltage switching devices
Wide Bandgap (~3.2 eV): Maintains superior electrical performance under high-temperature, high-field, and high-radiation conditions
Exceptional Thermal Conductivity: >4.9 W/cm·K, for rapid heat removal in high-power modules
Outstanding Mechanical Strength: Mohs hardness of 9.0 (second only to diamond), low thermal expansion, and excellent chemical stability
Atomically Smooth Surface: Ra < 0.4 nm with defect density < 1/cm², ideal for MOCVD/HVPE epitaxy and micro-nano fabrication
Available Sizes: 50, 75, 100, 150, 200 mm (2″–8″) standard; custom diameters up to 250 mm on request.
Thickness Range: 200–1 000 μm with ±5 μm tolerance.
High-Purity SiC Powder Preparation
Starting material: 6N–grade SiC powder purified via multi-stage vacuum sublimation and thermal treatment to reduce metal contaminants (Fe, Cr, Ni < 10 ppb) and eliminate polycrystalline inclusions.
Modified PVT Single-Crystal Growth
Environment: 10⁻³–10⁻² Torr near-vacuum
Temperature: Graphite crucible heated to ~2 500 °C; controlled thermal gradient ΔT ≈ 10–20 °C/cm
Gas Flow & Crucible Design: Porous graphite separators and tailored crucible geometry ensure uniform vapor distribution and inhibit unwanted nucleation
Dynamic Feed & Rotation: Periodic SiC powder replenishment and crystal-rod rotation yield low dislocation densities (< 3 000 cm⁻²) and consistent 4H/6H orientation
Deep-Level Compensation Annealing
Hydrogen Anneal: 600–1 400 °C in H₂ atmosphere for several hours to activate deep-level traps and compensate intrinsic carriers
N/Al Co-Doping (Optional): Precise incorporation of Al (acceptor) and N (donor) dopants during growth or post-growth CVD to create stable donor-acceptor pairs, driving resistivity peaks
Precision Slicing & Multi-Stage Lapping
Diamond-Wire Sawing: Slices wafers to 200–1 000 μm thickness with minimal damage layer; thickness tolerance ±5 μm
Coarse to Fine Lapping: Sequential use of diamond abrasives to remove sawing damage and prepare for polishing
Chemical Mechanical Polishing (CMP)
Polishing Media: Nano-oxide (SiO₂ or CeO₂) slurry in a mild alkaline suspension
Process Control: Low-stress polishing parameters deliver RMS roughness of 0.2–0.4 nm and eliminate micro-scratches
Final Cleaning & Class-100 Packaging
Multi-Step Ultrasonic Cleaning: Organic solvent → acid/base treatments → deionized water rinse, all performed in a Class-100 cleanroom
Drying & Sealing: Nitrogen purge drying, sealed in nitrogen-filled protective bags, and housed in anti-static, vibration-dampening outer boxes
No. | Wafer Size | Type/Dopant | Orientation | Thickness | MPD | RT | Polishing | Surface Roughness |
1 | 2" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 350 ± 25 um | <50 cm-2 | >=1E5 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
2 | 2" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 350 ± 25 um | <15 cm-2 | >=1E7 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
3 | 3" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 350 ± 25 um | <50 cm-2 | >=1E5 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
4 | 3" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 350 ± 25 um | <15 cm-2 | >=1E7 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
5 | 4" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 350 or 500 ± 25 um | <50 cm-2 | >=1E5 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
6 | 4" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 350 or 500 ± 25 um | <15 cm-2 | >=1E7 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
7 | 6" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 500 ± 25 um | <50 cm-2 | >=1E5 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
8 | 6" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 500 ± 25 um | <15 cm-2 | >=1E7 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
9 | 8" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 500 ± 25 um | <50 cm-2 | >=1E5 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
10 | 8" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 500 ± 25 um | <15 cm-2 | >=1E7 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
11 | 12" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 500 ± 25 um | <50 cm-2 | >=1E5 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
12 | 12" 4H | Semi-insulating / V or undoped | <0001>+/-0.5 degree | 500 ± 25 um | <15 cm-2 | >=1E7 Ω•cm | Double face polished/Si face epi-ready with CMP | <0.5 nm |
High-Power Electronics
SiC MOSFETs, Schottky diodes, high-voltage inverters, and fast-charging EV power modules leverage SiC’s low on-resistance and high breakdown field.
RF & Microwave Systems
5G/6G base-station power amplifiers, millimeter-wave radar modules, and satellite communication front-ends demand SiC’s high-frequency performance and radiation hardness.
Optoelectronics & Photonics
UV-LEDs, blue-laser diodes, and wide-bandgap photodetectors benefit from an atomically smooth and defect-free substrate for uniform epitaxy.
Extreme Environment Sensing
High-temperature pressure/temperature sensors, gas-turbine monitoring elements, and nuclear-grade detectors exploit SiC’s stability above 600 °C and under high radiation flux.
Aerospace & Defense
Satellite power electronics, missile-borne radars, and avionic systems require SiC’s robustness in vacuum, temperature cycling, and high-G environments.
Advanced Research & Custom Solutions
Quantum computing isolation substrates, micro-cavity optics, and bespoke window shapes (spherical, V-groove, polygonal) for cutting-edge R&D.
Why choose semi-insulating SiC over conductive SiC?
Semi-insulating SiC exhibits ultra-high resistivity via deep-level compensation, greatly reducing leakage currents in high-voltage and high-frequency devices, whereas conductive SiC is suited for lower-voltage or power MOSFET channel applications.
Can these wafers go straight into epitaxial growth?
Yes. We offer “epi-ready” semi-insulating wafers optimized for MOCVD, HVPE, or MBE, complete with surface treatment and defect control to ensure excellent epitaxial layer quality.
How is wafer cleanliness guaranteed?
A Class-100 cleanroom process, multi-step ultrasonic and chemical cleaning, plus nitrogen-sealed packaging ensure virtually zero particles, organic residue, or micro-scratches.
What is the typical lead time and minimum order?
Samples (up to 5 pieces) ship within 7–10 business days. Production orders (MOQ = 5 wafers) are delivered in 4–6 weeks, depending on size and custom features.
Do you offer custom shapes or substrates?
Yes. In addition to standard circular wafers, we fabricate planar windows, V-groove parts, spherical lenses, and other bespoke geometries.
ZMSH specializes in high-tech development, production, and sales of special optical glass and new crystal materials. Our products serve optical electronics, consumer electronics, and the military. We offer Sapphire optical components, mobile phone lens covers, Ceramics, LT, Silicon Carbide SIC, Quartz, and semiconductor crystal wafers. With skilled expertise and cutting-edge equipment, we excel in non-standard product processing, aiming to be a leading optoelectronic materials high-tech enterprise.