Brand Name: | ZMSH |
MOQ: | 1 |
Price: | by case |
Packaging Details: | custom cartons |
Payment Terms: | T/T |
The silicon carbide ceramic chuck is a high-performance platform designed for semiconductor inspection, wafer fabrication, and bonding equipment. With a lightweight design and advanced ceramic materials such as sintered SiC, reaction-bonded SiC, silicon nitride, and aluminum nitride, the chuck delivers outstanding performance in terms of high stiffness, low thermal expansion, excellent wear resistance, and long service life.
By combining precision engineering with advanced polishing techniques, the chuck achieves extremely high flatness, mirror-like surface quality, and long-term stability, making it an ideal solution for critical processes in the semiconductor industry.
High Precision
Surface flatness is controlled within 0.3–0.5 μm, ensuring exceptional wafer stability and reliable process accuracy.
Mirror Polishing
The surface achieves Ra 0.02 μm through advanced polishing techniques, minimizing wafer scratches and particle contamination, perfectly suited for ultra-clean environments.
Ultra-Lightweight
Compared to quartz or metal substrates, SiC ceramics provide high strength with significantly reduced weight, improving motion control, response speed, and positioning accuracy of the equipment.
High Stiffness
With excellent mechanical strength and Young’s modulus, the chuck maintains dimensional stability under heavy loads and high-speed operation, preventing deformation.
Low Thermal Expansion
The coefficient of thermal expansion (CTE) is close to that of silicon wafers, reducing thermal stress and ensuring wafer stability under varying process temperatures.
Outstanding Wear Resistance
SiC ceramics possess extreme hardness and superior wear resistance, maintaining flatness and precision even under long-term, high-frequency use, thereby extending product lifetime.
The production of SiC ceramic chucks requires extremely high precision and cleanliness. The typical process includes:
Raw Material Preparation
High-purity silicon carbide powder or SiC-based composite powders are carefully selected. Strict particle size control and ultra-low impurity levels ensure material uniformity and stability.
Forming Process
Advanced techniques such as pressureless sintering (SSiC) or reaction-bonded SiC (RSiC) are used to densify the powder into a strong ceramic substrate.
Sintering conditions such as temperature and atmosphere are carefully optimized to achieve fine, uniform microstructures.
Precision Machining
Post-sintering, the ceramic body undergoes CNC grinding, laser trimming, and ultra-precision machining, ensuring ±0.01 mm tolerance and ≤3 μm parallelism.
Surface Treatment
Multiple rounds of grinding and polishing achieve a mirror finish with Ra 0.02 μm.
Optional surface coatings or functional treatments can be applied for enhanced corrosion resistance or tailored friction properties.
Inspection & Quality Control
Advanced instruments such as interferometers and surface roughness testers are employed to ensure every chuck meets the strict specifications of the semiconductor industry.
Technical Parameters |
Value |
Unit |
---|---|---|
Flatness | 0.5 | μm |
Applicable specifications | 6/8”, 12”, 8/12” | — |
Surface feature | pin type, ring type | — |
Pin height | 0.05–0.2 | mm |
Pin min. diameter | ϕ0.2 | mm |
Min. pin spacing | 3 | mm |
Min. seal ring width | 0.7 | mm |
Surface roughness | Ra 0.02 | μm |
Thickness tolerance | ±0.01 | mm |
Diameter tolerance | ±0.01 | mm |
Parallelism tolerance | ≤3 | μm |
Semiconductor wafer inspection equipment
Wafer fabrication and transfer
Wafer bonding and packaging
Advanced optoelectronic device manufacturing
Precision instruments requiring extreme flatness and cleanliness
A1: SiC ceramic chucks are lighter, stiffer, and have a coefficient of thermal expansion close to silicon wafers, minimizing thermal deformation. They also offer outstanding wear resistance and a much longer service life.
A2: The flatness of our SiC ceramic chucks can be controlled within 0.3–0.5 μm, meeting the stringent requirements of semiconductor manufacturing.
A3: The surface is mirror-polished to Ra 0.02 μm, ensuring scratch-free wafer handling and minimizing particle contamination.
A4: Standard sizes include 6’’, 8’’, and 12’’ wafers, with customized dimensions and designs available upon request.
A5: SiC ceramics provide excellent high-temperature resistance and exhibit minimal deformation under thermal cycling, making them ideal for semiconductor processes.